8 nalezených zakázek
The subject matter of this Public Contract is supply (acquisition) of a set of instruments for electrical characterization of semiconductor devices (8 pieces): • High Power Source Measure Unit (1 piece), • Source Measure Unit (4 pieces), • Electrometer and High Resistance Meter with voltage source (1
The subject matter of this Public Contract is supply (acquisition) of a set of instruments for electrical characterization of semiconductor devices (8 pieces): • High Power Source Measure Unit (1 piece), • Source Measure Unit (4 pieces), • Electrometer and High Resistance Meter with voltage source (1
The subject matter of this Public Contract is supply (acquisition) of 3 pieces of LCR meters, which are used for measurement of critical electrical characteristics of semiconductor devices (bulk, coupling, or inter-channel capacitance, resistance of the selected components, etc.). The tender documents are available
The subject matter of this Public Contract is supply (acquisition) of a set of instruments for electrical characterization of semiconductor devices (8 pieces): • High Power Source Measure Unit (1 piece), • Source Measure Unit (4 pieces), • Electrometer and High Resistance Meter with voltage source (1
The subject matter of this Public Contract is supply (acquisition) of 3 pieces of LCR meters, which are used for measurement of critical electrical characteristics of semiconductor devices (bulk, coupling, or inter-channel capacitance, resistance of the selected components, etc.). The tender documents are available
Dodávka sady přístrojů pro elektrickou charakterizaci polovodičových součástek pro projekty CERN-IV a FORTE
The subject matter of this Public Contract is supply (acquisition) of a set of instruments for electrical characterization of semiconductor devices (8 pieces): • High Power Source Measure Unit (1 piece), • Source Measure Unit (4 pieces), • Electrometer and High Resistance Meter with voltage source (1
Předmětem veřejné zakázky je dodávka 3 ks přístrojů pro měření kritických elektrických charakteristik polovodičových komponent, jako jsou např. objemová či mezikanálová kapacita, odpor dílčích prvků apod.